FIELD: optoelectronics. SUBSTANCE: method involves illumination of scanning entity limiting of spectral radiation composition from entity of scanning; recording of reflected radiation within angles of 90 ± 10 deg; conversion of optical to electric signal; matching of linear relationships: dimensions of probing-radiation CRT rasters and video monitor; amplification of electric signal and its conversion into control signal for deflecting yokes of video monitor CRT. EFFECT: facilitated procedure. 1 dwg
Title | Year | Author | Number |
---|---|---|---|
VIDEO IDICATION DEVICE FOR RASTER ELECTRONIC MICROSCOPE | 0 |
|
SU687492A1 |
VISUAL CHECKING DEVICE FOR SCANNING ELECTRON MICROSCOPE | 0 |
|
SU1105961A1 |
0 |
|
SU524258A1 | |
VIDEO CHECKING DEVICE FOR SCANNING ELECTRON MICROSCOPE WITH DISPLAY SYSTEM | 0 |
|
SU1218425A1 |
METHOD OF MONOCRYSTAL X-RAY TOPOGRAPHY | 0 |
|
SU851213A1 |
ELECTRONIC RASTER MICROSCOPE | 0 |
|
SU682967A1 |
X-RAY SCANNING DEVICE | 1994 |
|
RU2120234C1 |
SCANNING DEVICE FOR REPRODUCING SPECIMEN IMAGE | 0 |
|
SU920894A1 |
SCANNING OPTIC MICROSCOPE | 0 |
|
SU1797717A3 |
OPTOELECTRONIC SYSTEM | 1988 |
|
SU1841031A1 |
Authors
Dates
1994-08-15—Published
1991-04-15—Filed