DEVICE FOR MEASURING PARAMETERS OF PHASED ARRAY Russian patent published in 1995 - IPC

Abstract RU 2042140 C1

FIELD: array measurement technology. SUBSTANCE: element of the phased array to be measured is subjected to phase manipulation together with phase manipulation of the rest phased array elements at doubled manipulation frequency of the element. Device performs separation of reference signals at carrier frequency of the transmitter and at manipulation frequency of the element to be measured from the phase-manipulated signal of the rest phased-array elements, which are used for detecting phase-manipulated signal of the element to be measured. EFFECT: improved precision of measurement. 1 dwg

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RU 2 042 140 C1

Authors

Letunov L.A.

Mosolov G.Ju.

Dunaev I.B.

Dates

1995-08-20Published

1992-01-13Filed