FIELD: test technique. SUBSTANCE: device has reference-frequency generator 1, reference-frequency counter 2, delay element 3, nor gate 4, D flip-flop 5, register 6, shaper 7, AND gate 8, analyzed frequency counter 9, input bus 10. EFFECT: improved design. 1 dwg
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Authors
Dates
1996-02-20—Published
1992-10-09—Filed