FIELD: flaw detection in electric conducting objects. SUBSTANCE: device has opened magnetic circuit 5 which ends are located in plane that is parallel to plane of coils of measuring element 1. Current guide 4 is designed as flat bus, which touches ends of opened magnetic circuit 5 its inner and outer surface. Part of current guide 4, which touches outer surface of magnetic circuit 5 has loop which embraces cross section of closed magnetic circuit 6. Measuring element 1 is located in symmetry about ends of opened magnetic circuit 5. Measuring element 1 is protected by non-ferromagnetic metal shielding plate 11, which covers working end of measuring element 1 and which is located between outer edges of end of opened magnetic circuit 5. Sensitivity to flaws of different orientation is balanced by introduced second current winding 10, which is turned on opened magnetic circuit 5 and is located in symmetry about its ends. EFFECT: increased functional capabilities. 6 cl, 6 dwg
Title | Year | Author | Number |
---|---|---|---|
FLAW DETECTOR ELECTROMAGNETIC TRANSDUCER | 1995 |
|
RU2085931C1 |
ELECTROMAGNETIC DEFECTOSCOPY DEVICE | 0 |
|
SU1803849A1 |
EDDY-CURRENT FLAW DETECTOR | 1995 |
|
RU2085932C1 |
EDDY CURRENT TRANSDUCER FOR FLAW DETECTORS | 0 |
|
SU1679353A1 |
FLUX-THROUGH EDDY-CURRENT TRANSDUCER FOR FLAW DETECTOR | 0 |
|
SU1302182A1 |
BUSING-TYPE EDDY CURRENT CONVERTER FOR FLAW DETECTOR | 0 |
|
SU1385056A2 |
ELECTROMAGNETIC TRANSDUCER FOR FLAW DETECTION | 0 |
|
SU1786419A1 |
METHOD OF MEASURING PARAMETERS OF ELECTROCONDUCTIVE OBJECTS AND DEVICE FOR EFFECTING SAME | 0 |
|
SU748233A1 |
METHOD AND APPARATUS FOR NON-DESTRUCTIVE TESTING | 0 |
|
SU746278A1 |
PASS-THROUGH EDDY-CURRENT TRANSDUCER | 0 |
|
SU637659A1 |
Authors
Dates
1996-06-27—Published
1993-05-24—Filed