FIELD: measurement technology. SUBSTANCE: device for checking parameters of logical elements under electromagnetic noise effects has isolating parts unit, subtracting parts unit, display unit, OR gate, and inverter. Device determines susceptibility threshold of digital integrated circuits having several outputs within short time identifies terminal leads most responsive to noise signal effect, dispenses with recording random failures, controls parameters of digital integrated circuits of various functional applications. EFFECT: enlarged functional capabilities due to simultaneous check-up of variations in all output signals of multioutput digital integrated circuits under electromagnetic noise effects and separate display of operation failure for each output. 2 dwg
| Title | Year | Author | Number |
|---|---|---|---|
| DEVICE FOR AUTOMATIC MEASURING OF NON-LINEAR ELEMENT PARAMETERS | 0 |
|
SU1132258A1 |
| AUTOMATIC DEVICE FOR MEASURING PARAMETERS OF RADIO-ENGINEERING ELEMENTS OR DEVICES | 0 |
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| APPARATUS FOR AUTOMATIC MEASURING OF PARAMETERS OF VARICAPS | 0 |
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| DIGITALLY CONTROLLED GENERATOR | 0 |
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| DIGITAL VARIABLE GENERATOR | 0 |
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| DIGITAL CONTROLLED GENERATOR | 0 |
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| ARRANGEMENT FOR MEASURING COORDINATES OF FIELD-TRANSISTOR THERMOSTABLE POINT | 0 |
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| DEVICE FOR AUTOMATIC MEASUREMENT OF TUNED-CIRCUIT PARAMETERS | 0 |
|
SU1406525A1 |
