FIELD: inspection of physico-chemical processes of polymerization, structure forming, degree of solidification and of processes of material ageing. SUBSTANCE: device for implementation of method has fixed frequency generator and generator of controlled frequency, wide-band and standard frequency dividers, two automatic commutators, sensor, current-to-voltage converter, two multipliers, two low-pass filters, two amplifiers of commutation frequency, two phase-sensitive rectifiers, two indicators. Reference and probing voltages excite in turn electric field of sensor which interacts with inspected material. At same time they are multiplied with corresponding currents flowing through sensor. Constant components of variable voltages are isolated. In case of their inequality variable voltages are isolated. In case of their inequality variable component is isolated, amplified, rectified and fixed by indicator. Either attenuated voltage or probing high-frequency voltage can be multiplied in multiplier. Second measurement channel operates in same manner as first one. Zero readings of indicators are set on each frequency of generator of probing voltage and reading of corresponding value of dispersion of dielectric loss factor is conducted by value of standard frequency divider by formula. EFFECT: expanded application field. 2 cl, 1 dwg
Title | Year | Author | Number |
---|---|---|---|
METER OF DETUNING OF SHF RESONATOR | 1991 |
|
RU2014623C1 |
POLYMER FILM THICKNESS METER | 0 |
|
SU1124178A1 |
METHOD OF MEASURING FREQUENCY DEPENDENCE OF DIELECTRIC PERMEABILITY AND DEVICE FOR REALIZATION | 0 |
|
SU1803885A1 |
POLYMERIC FILM THICKNESS METER | 0 |
|
SU892201A1 |
METER OF PARAMETERS OF DIELECTRIC AND CONDUCTING MEDIA | 0 |
|
SU1051456A1 |
DIELECTRIC FREQUENCY PROPERTY METER | 0 |
|
SU1041922A1 |
APPARATUS FOR INSPECTING COMPOSITION AND PROPERTIES OF MATERIALS | 0 |
|
SU1188620A1 |
POLYMER FILM THICKNESS METER | 0 |
|
SU1158857A1 |
DEVICE FOR CHECKING PARAMETERS OF MULTICOMPONENT MATERIALS | 0 |
|
SU1774242A1 |
WIDE-BAND METER OF DIELECTRIC PARAMETERS | 0 |
|
SU1109670A1 |
Authors
Dates
1997-04-27—Published
1991-11-26—Filed