DIFFRACTION-MEASURING METHOD FOR DETECTION OF CRYSTAL-AXES ORIENTATION IN BIG SINGLE-CRYSTAL OF KNOWN STRUCTURE Russian patent published in 1997 - IPC

FIELD: optical instruments. SUBSTANCE: method involves exposition of crystal surface to monochromatic X-rays. Crystal is rotated about axis of diffraction meter and in orientation plane in order to detect maximal reflection angles ω₁ and ω₂,. In addition in this position angles Φ₁ and Φ₂ of crystal position in rotation plane which is perpendicular to equatorial plane of goniometer. Method involves using of specific coordinate network for setting angles Φ₁ and Φ₂, detection of normal inclination to reflection plane with respect to orientation plane, and calculation of normal entrance to gnomonic stereographic projection by angle δ = (ω₂-ω₁)/2. Calculated projections of normal are used for calculation of total gnomonic stereographic projection of investigated crystal. This results in possibility to detect orientation of all cutting edges of diamond single-crystal tool with respect to its base planes. EFFECT: elimination of additional logging. 1 dwg, 2 tbl