Patenton — panteon of patents

(19)

RU

(11)

2 085 917

(13)

C1

(51)

IPC

(21) (22)

Application

93002633/25, 1993-01-13

(22)

Actual filing date

1993-01-13

(45)

Published

1997-07-27

(72)

Inventor

Makarov A.E.Gruzdov V.V.Arkhipov Ju.G.

(73)

Holder

Nauchno-Proizvodstvennoe Ob"Edinenie

DIFFRACTION-MEASURING METHOD FOR DETECTION OF CRYSTAL-AXES ORIENTATION IN BIG SINGLE-CRYSTAL OF KNOWN STRUCTURE Russian patent published in 1997 - IPC

Abstract RU 2085917 C1

FIELD: optical instruments. SUBSTANCE: method involves exposition of crystal surface to monochromatic X-rays. Crystal is rotated about axis of diffraction meter and in o