FUNCTIONAL INSPECTION DEVICE FOR SINGLE-CHIP MICROCONTROLLER Russian patent published in 2004 - IPC

FIELD: digital computer engineering.

SUBSTANCE: proposed device that can be used in computer-based systems for inspecting microcomputers incorporating digital input/output circuits and has switching unit, test-sequence read-only memory unit, random-access memory unit, personal computer, and home setting unit for single-chip microcontroller under inspection is provided in addition with control-function single-chip microcontroller, read-only memory device of control-function single-chip microcontroller, home setting unit for control-function single-chip microcontroller, serial interface unit, control signal decoding unit, address shaping unit for test-sequence memory devices, recording unit for random-access memory unit, read-out unit for random-access memory unit, address shaping unit for random-access memory unit, and display unit.

EFFECT: facilitated control and maintenance procedures for user.

1 cl, 3 dwg