MODE OF METROLOGICAL CERTIFICATION OF A STATISTICAL ANALYZER Russian patent published in 2006 - IPC G01R29/00 

Abstract RU 2290651 C2

FIELD: the invention refers to measuring technique and may be used for increasing accuracy of metrological certification of statistical analyzer.

SUBSTANCE: for achieving the given result generation of testing signals is made with given exemplary densities of distribution probabilities of appearance of momentary meanings of the testing signal. At that the determinate signals satisfy the given distribution on the basis of the task of distribution of probabilities of appearance momentary meanings of the testing signal.

EFFECT: increases accuracy of metrological certification of statistical analyzers.

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RU 2 290 651 C2

Authors

Lukinykh Oleg Gennad'Evich

Dates

2006-12-27Published

2004-12-21Filed