HOLOGRAPHIC INTERFEROMETRE FOR MEASUSURING DEFORMATIONS OF FLAT SURFACE OF SOLID-STATE ELECTRONICS ELEMENTS Russian patent published in 2010 - IPC G01B9/25 G01B11/16 

Abstract RU 2406070 C1

FIELD: physics.

SUBSTANCE: holographic interferometre has a radiation source with a collimator, an objective lens, an object under analysis, a photoplate and an intermediate optical medium placed between the photoplate and the object under analysis. The intermediate optical medium is in form of a periodic structure of projections and depressions, which can be made with period of 200-5000 mcm and ratio of the side of the projection to distance between the projections equal to 1:10.

EFFECT: higher accuracy of measuring deformations of the flat surface of solid-state electronics elements.

3 cl, 11 dwg

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RU 2 406 070 C1

Authors

Borynjak Leonid Aleksandrovich

Nepochatov Jurij Kondrat'Evich

Dates

2010-12-10Published

2009-03-10Filed