FIELD: physics.
SUBSTANCE: method is carried out by including in a device, having an interface unit, a control unit, n input registers, n input/output mask registers, n input mask registers, n memory units, a first group of n switches with three states at the outputs, n comparator units, n result registers, a second group of n switches, n output switches, n breakdown flip-flops, an OR element and n control registers, additional n test registers with corresponding links, by changing links of the memory units, input mask registers, control registers and corresponding change of the structure of the control unit of the device.
EFFECT: facilitating independent real-time switching of different groups of bidirectional control terminals of the device from transmitting test information to receiving a response with arbitrary discreteness of switching, which enables to perform test control of digital devices with multiple groups of bidirectional communication lines, particularly multiple-processor systems.
2 cl, 3 dwg
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Authors
Dates
2015-10-20—Published
2014-12-25—Filed