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(19)

(11)

2 613 844

(13)

(51)

IPC

G06G7/00(2006-01-01)

G06G7/52(2006-01-01)

G06F17/40(2006-01-01)

H04B17/00(2015-01-01)

(21) (22)

Application

2016114624, 2016-04-14

(24)

Start date

2016-04-14

(22)

Actual filing date

2016-04-14

(45)

Published

2017-03-21

(72)

Inventor

Semisoshenko Mikhail AleksandrovichStrelkov Igor Olegovich

(73)

Holder

Federalnoe Gosudarstvennoe Kazennoe Voennoe Obrazovatelnoe Uchrezhdenie Vysshego Obrazovaniya Akademiya Svyazi Imeni Marshala Sovetskogo Soyuza S.M. Budennogo" Ministerstva Oborony Rossijskoj Federatsii

DEVICE FOR MEASURING CHARACTERISTICS OF RANDOM PROCESSES Russian patent published in 2017 - IPC G06G7/00 G06G7/52 G06F17/40 H04B17/00

Abstract RU 2613844 C1

FIELD: measuring equipment.

SUBSTANCE: first target sequence averager (16), the fourth detector (17), the second target sequence averager (18), a subtractor (19) and the fourth divider (20), the output of which is the fifth device output, are further introduced into the device for measuring the characteristics of random processes.

EFFECT: improved accuracy of determining the m parameter of the random process with the Nakagami distribution.

1 dwg

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RU 2 613 844 C1

Authors

Semisoshenko Mikhail Aleksandrovich

Strelkov Igor Olegovich

Dates

2017-03-21—Published

2016-04-14—Filed