FIELD: measuring equipment.
SUBSTANCE: proposed invention can be used to create aggregated measuring complexes with enhanced functionality and improved accuracy, including standard measuring instruments (SMI), specialized hardware and software modules, standard PCs. Various types of oscilloscopes, strobe light meters, including high-speed ones, can be used as SMI. Aggregated measuring systems are necessary for research and testing of high-speed radioelectronic products of various classes. Use of the SMI complexes and standard PCs in the composition allows to minimize the costs of their creation; when creating high-speed testers for parametric control and testing of VLSI, VHSIC and functional units of on-board computer systems. Solution of the problem of input parametric control of the element base of computer systems allows to increase the reliability of radio-technical systems of remote control, ATC, navigation and landing; when creating parametric analyzers-emulators of system backbones of on-board computer systems. Wide use of the mainline-modular principle of building on-board computer systems makes the problem of parametric control of system buses in the development of highly reliable radio engineering systems in the power industry urgent; in medicine, in reflex therapy; to identify unauthorized connections to communication devices. Most effective use of the proposed invention in the creation of highly integrated high-speed onboard computer systems of ATC systems, navigation and landing. Increasing requirements for the reliability of on-board radio-electronic systems lead to the need to improve the accuracy characteristics of the measuring instruments used, the expansion of their functionality in the conduct of integrated research, as well as the inclusion of measuring instruments in various information and measurement systems, complexes of semi-simulation, automated design stations. Significance of the problem associated with the interrelation of parametric and functional identifications of the LSI of on-board ECM and system backbones of radio engineering systems (RES). This relationship allows us to predict the occurrence of functional failures of the RES, with unfavorable combinations of technological, climatic and operational factors, and also provide for measures to reduce the probabilities of parametric and functional failures and, accordingly, to increase the reliability of the RES. Considered technical solutions provide an increase in the accuracy and reliability of the amplitude measurements due to the ability to determine the nature and characteristics of the transient processes in the circuits of the device under investigation, along with this, the possibility of measuring the parameters of the equivalent circuits of the device under study provides the possibility of a complex evaluation of the source of the signals under study both at constant and alternating current; combination of measurement and calibration processes in one channel, with the elimination of the influence of calibration signals on the device under study; combination of processes of measuring and emulating the effects on the device under investigation in the same channel with an independent setting of the emulation of influences and measurements.
EFFECT: technical result observed in the implementation of the claimed solution is increased accuracy and reliability of amplitude measurements.
1 cl, 8 dwg, 6 tbl
