METHOD OF TESTING RANDOM-ACCESS MEMORIES Russian patent published in 2018 - IPC G11C29/20 

FIELD: computer engineering.

SUBSTANCE: invention relates to computer engineering. Method for testing a RAM in which, by using a P-bit pseudo-random number generator based on a cyclic shift register with linear feedback and a repetition period M, whose structure is preliminarily determined based on an inequalities system, at least K test cycles are performed consecutively, each of which performs, with sequential alternation, the procedure of writing test L-bit pseudo-random numbers to all N cells of the RAM, and then the procedure for reading from each RAM cell the data recorded in them and comparing them with test pseudo-random numbers, while in the procedure for generating test L-bit pseudo-random numbers, the value of each bit in them is simultaneously formed directly or by 2-modulus convolution from the current values of bits of the P-bit pseudo-random number generator such that in each i-th bit of the j-th test word the r-th symbol of the pseudo-random sequence with the repetition period M is formed.

EFFECT: technical result consists in increasing the efficiency of detecting faults caused by the information interaction of memory elements.

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