FIELD: electrical engineering.
SUBSTANCE: group of inventions relates to the field of electrical engineering and electronics, can be used in power supply devices, in power storage devices, etc. Methods for monitoring the serviceability of a capacitor bank containing capacitors connected to the power buses through low-power low-ohmic resistors, high-ohmic resistors connected to the control bus and having different ratings, as well as a common power bus are disclosed. First variant of the method ensures the detection of a defective capacitor in the absence of a supply voltage. For implementing the method, perform a measurement of the resistance of the control bus of the capacitor bank relative to the common power bus, comparison of the measured value of the resistance of the control bus of the capacitor bank with the nominal value of the resistance of the control bus and the expected values of the resistance of the control bus for cases of failure of one of the capacitors. If the measured resistance value of the control bus and its nominal resistance value are matched, the serviceability of the capacitor bank is stated, and if the measured value of the resistance of the control bus and one of the expected values of the resistance of the control bus are matched, a destroyed low-power low-ohmic resistor and a capacitor having a “short-circuit” defect are detected, and a specific fault in the capacitor bank is stated. Second variant of the method provides detection of a defective capacitor in the presence of a supply voltage. Method includes measuring the supply voltage U, while measuring the current rate I in the circuit between the control bus and the common power bus of the capacitor unit. If I=0, the serviceability of the capacitor bank is stated, and if I>0, calculate the resistance of the high-ohmic resistor according to the formula R=U/I, compare the calculated value of the resistance R with the resistance values of the high-ohmic resistors of the capacitor bank. Next, choose a high-ohmic resistor, the nominal value of the resistance which corresponds to the calculated value of the resistance R and determine the destroyed low-power low-ohmic resistor connected in series to the selected high-ohmic resistor, detect a defective capacitor connected to the selected high-ohmic resistor, and a specific fault in the capacitor bank is stated.
EFFECT: simplification of the control of the serviceability of the capacitor bank at any stage of its manufacture, as well as during testing and use as part of the device, system, product, including during normal operation; operative detection of a specific capacitor that failed due to the “short circuit” type (breakdown) without disassembling the equipment when it is turned off or powered on, including during normal operation.
2 cl, 4 dwg
