METHOD, SENSOR DEVICE AND DISPLACEMENT MEASUREMENT SYSTEM BASED ON QUANTUM PROPERTIES OF ATOMIC BEAMS Russian patent published in 2023 - IPC G01C21/12 

FIELD: measurement devices.

SUBSTANCE: invention is related to devices for measuring kinematic parameters of movement of objects in space in real time. The displacement measurement process is based on formation of a monochromatic atomic beam with a given average velocity and a given direction of motion, based on a focused ion beam (FIB), registration of the starting time of the beginning of the beam fragment and coordinates of the spatial beginning of the beam fragment, detection of beam particles that have reached the sensitive elements of the detector, with registration of the time of arrival of the three-dimensional coordinate profile, reconstruction in the computer of the space-time evolution of the beam from the known starting characteristics of each fragment until the moment of registration by the detector elements after passing through the working volume with the calculation of the increment of the polar angle, azimuth and distance traveled for the time during which these increments are obtained, which makes it possible to trace the dependence in real time of all spatio-temporal movements of a device or an object rigidly mechanically connected with it.

EFFECT: increase of accuracy of real-time measurements of all spatio-temporal movements.

3 cl, 6 dwg