FIELD: measurement technology. SUBSTANCE: device has former of injecting pulses, former of reference voltage, first and second resistors, operational amplifier with terminals to connect examined semiconductor across input and output, first and second retrieval and storage units, scaling converter and pulse generator which first output is connected to inputs of former of injecting pulses and former of reference voltage which outputs are correspondingly connected via first and second resistors to first input of operational amplifier. Second input of amplifier is connected to common bus and output of operational amplifier is connected to input of first retrieval and storage unit. Second and third outputs of pulse generator are connected correspondingly to controlling inputs of first and second retrieval and storage units. For increase of sensitivity of measurements device is supplemented with key, source of constant voltage, first and second voltage summing units, third retrieval and storage unit, differentiator and voltage subtractor which first input is connected to output of operational amplifier, which second input is linked to output of first retrieval and storage unit. Output of voltage subtractor is connected to analog input of key which controlling input is connected to first output of pulse generator. Output of key is connected to first inputs of first and second voltage summing units. Output of source of constant voltage is connected to second input of first voltage summing unit which output is connected to input of scaling converter. Output of converter is connected to inputs of third retrieval and storage unit and differentiator. Output of differentiator is connected to second input of second voltage summing unit which output is connected to input of second retrieval and storage unit. Output of this unit is connected to controlling input of scaling converter. Controlling input of third retrieval and storage unit is connected to second output of pulse generator. EFFECT: increased accuracy of measurement.
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Authors
Dates
1997-12-10—Published
1984-06-29—Filed