PLANT FOR HIGH-TEMPERATURE MEASUREMENTS OF SPECTRAL COEFFICIENTS OF SPECULAR REFLECTION Russian patent published in 1995 - IPC

FIELD: photometry. SUBSTANCE: standard item and samples are put on flat table inside electric furnace with point support on symmetry axis. Adjustment including vertical and horizontal translation of table together with furnace is conducted after heating of samples and standard item and needed inclinations of table are performed by adjustment levers prostruding outwards from furnace housing. Placing standard item and each sample in turn in ray path one conducts measurements with horizontal translation of furnace by spectrum points with the aid of known method. EFFECT: increased precision and productivity of measurements by elimination of effect of temperature deformations. 3 dwg