FIELD: measuring devices. SUBSTANCE: interferometer has monochromatic light source, telescopic system that functions to extend light beam and incorporates microlens, beam splitter, collimator lens, and beam-splitting grating, planar reflecting grating spaced from beam-splitting one at distance exceeding size of checked object surface, as well as recording device. Collimator lens and beam-splitting grating are built as a single concave reflecting diffraction grating whose optical axis and that of flat reflecting grating are set at an angle equal to diffraction angle of concave reflecting grating. Ratio of dash rate of concave reflecting grating to that of planar reflecting grating is 1: 8. EFFECT: improved checking accuracy, simplified design, reduced size.
Title | Year | Author | Number |
---|---|---|---|
INTERFEROMETER FOR MEASURING NON-PLANENESS AND NON-RECTILINEARITY OF SURFACE | 0 |
|
SU1046606A1 |
SHIFT INTERFEROMETER WITH SYNTHESIZED BASE BEAM | 0 |
|
SU811071A1 |
INTERFEROMETER FOR CHECKING PLANENESS OF REFLECTING SURFACES | 0 |
|
SU1760312A1 |
DOUBLE-BEAM INTERFEROMETER | 2002 |
|
RU2209389C1 |
GRATING INTERFEROMETER | 0 |
|
SU1818547A1 |
INTERFEROMETER FOR OPTICAL SURFACE QUALITY CONTROL | 0 |
|
SU1104362A1 |
INTERFEROMETER FOR TESTING CONCAVE ASPHERIC SURFACES | 0 |
|
SU1753258A1 |
INTERFEROMETER | 0 |
|
SU1190187A1 |
INTERFEROMETER FOR CHECKING LENS AND MIRROR ABERRATION CHANGES IN THE PROCESS OF THEIR MOUNTING POSITION | 0 |
|
SU848999A1 |
INTERFEROMETER | 0 |
|
SU603840A1 |
Authors
Dates
1997-01-20—Published
1981-05-11—Filed