FIELD: computer engineering. SUBSTANCE: test former has pseudorandom code generator, test output multiplexer, pseudorandom pulse train generator, microtest code train storage unit, control unit. Command and data code train generated at former output is essentially pseudorandom sequence of regular routines whose appearance probability is described by multilink Markov chain. Command codes are generated by test output multiplexer. Command operands are produced by either pseudorandom code generator or test output multiplexer. Combination of random and regular test effects affords better completeness of formed tests and reduced check-up time. EFFECT: improved completeness of formed tests and reduced check-up time. 6 dwg, 1 tbl
Title | Year | Author | Number |
---|---|---|---|
TEST FORMER | 1991 |
|
RU2010316C1 |
TEST DRIVER | 0 |
|
SU1661769A1 |
TEST SHAPER | 0 |
|
SU1552185A1 |
DEVICE FOR CHECKING MICROPROCESSOR UNITS | 0 |
|
SU1332320A2 |
DEVICE FOR CHECKING MICROPROCESSING UNITS | 0 |
|
SU1531099A1 |
MICROPROGRAM CONTROL DEVICE | 0 |
|
SU1667070A1 |
DEVICE FOR CHECKING DIGITAL BLOCKS | 0 |
|
SU1314344A1 |
COMPUTER-AIDED SYSTEM FOR CHECKING RADIOELECTRONIC DEVICES | 0 |
|
SU1683038A1 |
TEST GENERATOR | 0 |
|
SU1635187A1 |
DEVICE FOR TEST CHECKING OF DIGITAL UNITS | 0 |
|
SU1312577A1 |
Authors
Dates
1994-05-15—Published
1991-09-26—Filed