METHOD FOR DIAGNOSING STAGNATED LAYER GROWTH Russian patent published in 1994 - IPC

Abstract RU 2014168 C1

FIELD: diagnostics. SUBSTANCE: reference pass at speed V is made, physical parameter f, for example, cutting emf, is measured, coefficient of proportionality K in a reference relation F=k ln(V) is determined. A working pass at speed Vw is made, parameter fw is measured and the availability of a stagnated layer is diagnosed on condition of kln(Vw)>fw. EFFECT: improved accuracy. 15 cl, 9 dwg

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RU 2 014 168 C1

Authors

Vasil'Ev S.V.

Dates

1994-06-15Published

1990-03-20Filed