METHOD FOR DIAGNOSTICS OF COMBINATION LOGICAL CIRCUITS Russian patent published in 1994 - IPC

FIELD: computer engineering. SUBSTANCE: method is based on measuring number of logical changes at output terminals of logical circuits. Coefficients of transparency of i-th input to output are determined for units corresponding to different errors of tested circuit. Key pattern of frequency X_i, which corresponds to resolution of monitor of logical changes, is applied to F_hep input of tested circuit. Key patterns of different frequencies are applied to other N-1 inputs. Duration of pulse half-period of maximal applied frequency should be at least twice as pulse half-period of frequency F_hep. Transparency coefficient is determined by the equation Z/2(N-1), where Z is number of time intervals where more than two logical periods were detected, N is number of input terminals of tested circuit. Comparison of transparency coefficients for circuits with different faults and transparency coefficient which was get from experiment provides necessary information. EFFECT: improved diagnostics. 5 dwg