FIELD: testing of semiconductor devices. SUBSTANCE: device has base in the form of bearing frame with support carrying swivel frame that mounts loading mechanism in the form of loading magazine with lip carrying auxiliary magazine, cutting mechanism provided with Г-shaped hold-down device for integrated circuits, straightening mechanism affording sequence displacement of straightening jaws, contacting mechanism, mechanism for sorting out according to electrical characteristics, and braking facility, all arranged in appropriate sequence. EFFECT: improved functional capability, increased output of serviceable products. 6 dwg
Title | Year | Author | Number |
---|---|---|---|
DEVICE FOR CLIMATIC TEST OF SEMICONDUCTOR DEVICES | 1991 |
|
RU2042295C1 |
INTEGRATED CIRCUIT CHARACTERISTIC CHECKING DEVICE | 1991 |
|
RU2043640C1 |
0 |
|
SU1781860A1 | |
APPARATUS FOR STRAIGHTENING LEADS OF ELECTRONIC COMPONENTS | 0 |
|
SU1123122A1 |
RADIO COMPONENT PINS STRAIGHTENING DEVICE | 0 |
|
SU1714825A1 |
0 |
|
SU508807A1 | |
DEVICE FOR AUTOMATIC SORTING OF SEMICONDUCTOR DEVICES | 0 |
|
SU983836A1 |
DEVICE FOR STRAIGHTENING LEADS OF ELECTRONIC COMPONENTS | 0 |
|
SU1302449A1 |
MAGAZINE FOR MICROCIRCUITS AND CASSETTE HOLDER | 1991 |
|
RU2023328C1 |
0 |
|
SU557436A1 |
Authors
Dates
1994-10-30—Published
1991-06-06—Filed