METHOD OF DETERMINING LAYER THICKNESS Russian patent published in 1994 - IPC

FIELD: measurement technology; flaw detection. SUBSTANCE: method involves the steps of: periodically thermally affecting a specimen surface on one side, recording variations in its temperature in a check point and determining a phase difference between oscillations of heat flow and layer temperature in check points. The device for effecting method has electric power source 1 coupled with heat flow source 2, heat flow modulator 3, infra-red radiation sensor 5, DC potentiometer, amplifier 7, and mirror- galvanometer oscillograph. EFFECT: enhanced accuracy and widened range of layers to be measured by determining their thickness of low heat condition materials and cylindrical layers. 3 cl, 3 dwg