BENCH FOR TESTING THERMALLY STRESSED OBJECTS Russian patent published in 1995 - IPC

Abstract RU 2029233 C1

FIELD: test benches. SUBSTANCE: bench has a vacuum chamber where an object to be tested is placed, electron gun, electric power supply and control system for the electron gun, cooling system for cooling the object during testing, focusing lens for focusing electron flow, prober for measuring electron flow, recording system for measuring and indicating thermophysical parameters, holographic device for measuring and indicating thermal stresses, infra-red imager for measuring and indicating thermograms, the information being derived through central and side branch pipes. EFFECT: widened range of objects to be tested in a wide measurement range and with high resolution. 2 dwg

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RU 2 029 233 C1

Authors

Apollonov V.V.[Ru]

Afanas'Ev Viktor Il'Ich[Ua]

Kopylov Vladimir Nikolaevich[Ua]

Lukin Konstantin Aleksandrovich[Ua]

Odnorozhenko Ivan Grigor'Evich[Ua]

Dates

1995-02-20Published

1990-12-13Filed