DEVICE MONITORING NONLINEARITY CHARACTERISTICS OF ELECTRON DEVICES Russian patent published in 1995 - IPC

Abstract RU 2040800 C1

FIELD: measurement technology. SUBSTANCE: device monitoring nonlinearity characteristics of electron devices has reference generator 1, examined unit 2, phase inverter 3, former 4, storage and retrieval units 5, 6, divider 7, indicator 8. Former includes comparators, OR-ELSE gate, NOT-AND gate, NOT gate, time-pulse converter, peak detector. EFFECT: expanded application field. 3 cl, 3 dwg

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RU 2 040 800 C1

Authors

Kelekhsaev Boris Georgievich

Dates

1995-07-25—Published

1993-08-10—Filed