DEVICE FOR EMBEDDING PROBE AND TAKING PROFILOGRAMS OF SURFACES Russian patent published in 1998 - IPC

FIELD: construction engineering. SUBSTANCE: this is intended for measuring density of grounds with taking surface profilograms. Measurements are made when device is moving over surface. Guide members of device are mounted on axles which rest on ground wheels introduced in device. Guide members are located at equal distances from ground wheel axes and can perform oscillation motions in vertical plane. Device is also provided with spring-biased slide member which is intended for installing probe arranged on guide member with possibility of moving along it. There is unit for taking surface profilograms which is made in the form of disk being spring-biased to slide member in its lower part. Aforesaid disk interacts with sensor of probe moving start. Sensor is installed on slide member. Also incorporated is sensor of frame deviation from vertical line which is installed on frame. Application of device allows for increase of productivity at measuring ground density due to fact that measurements are made during movement of device and there is no need to spend time for installing and dismantling of device. Technological potentialities are widened because simultaneously with measuring hardness, surface profilograms are taken. In addition, labour intensity in taking measurements is reduced as probe is embedded automatically depending on movement of device. EFFECT: higher efficiency. 4 dwg