FIELD: test and diagnostics of parameters of thyristor converters that are controlled by means of microprocessors. SUBSTANCE: proposed testing device has mating unit to which inputs signals of control over proper thyristors come and which outputs are connected to inputs of logic NAND gate, univibrator, register and microprocessor. Inputs of NAND gate are connected to working inputs of register and its output is linked to interruption input of microprocessor and input of univibrator. Output of the latter is connected to gating input of register, register outputs are connected to data buses of microprocessor. Reading output of microprocessor is connected to enable input of register. EFFECT: simplified design of device, increased reliability of test of control pulses, enhanced informativity on point of disappearance of control pulse and number of faulty channel. 1 dwg, 2 tbl
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Authors
Dates
1998-05-20—Published
1996-03-19—Filed