TESTER OF HIGH-POWER ELECTRONIC DEVICES Russian patent published in 1998 - IPC

FIELD: tests of electronic devices, specifically, electric tests of high-voltage high-power under pulse quasi- dynamic modes, design and manufacture of high-voltage electronic devices. SUBSTANCE: tester has two power supply sources: low-power high-voltage and high- power low-voltage ones, charging resistor connected to high-voltage power supply source and reservoir capacitance connected to anode of tested electronic device. Isolation high-voltage diode is placed between anode of tested electronic device and low-voltage power supply source. Additional charging network consists of commutation device and first equivalent resistor connected in series. Anode of this commutation device is connected to positive lead-out of high-voltage power supply source. First equivalent resistor is connected to anode of tested electronic device. Cathode of additional isolation high-voltage diode is connected to anode of tested electronic device and its anode - to charging resistor. Network of capacitance and second equivalent resistor connected in series is placed between their connection point and common lead- out of tester. EFFECT: improved testing efficiency. 1 dwg