DEVICE MEASURING ROUGHNESS AND WAVINESS OF SURFACE UNDER FIXED VALUES OF BASE LENGTH Russian patent published in 1998 - IPC

FIELD: measurement technology. SUBSTANCE: device includes base with hole, illumination system to form incident radiation anchored on base, optical reception system composed of photodetector, rotary modulator which cylindrical surface has holes and signal processing unit incorporating amplifier, key unit connected to output of additional photodetector, subtracter, unit for division, averaging, separation and storage of signals and indicator. Optical unit of spatial filtration of radiation of illumination system is manufactured in the form of two coaxial lenses placed one from another at distance equal to sum of their focal distances. Screen having slit made in parallel to base is located in point of matching of focuses. EFFECT: increased measurement accuracy, measurement results of this device are identical to measurement results of roughness indicators. 3 dwg