DEVICE TO MEASURE SURFACE ROUGHNESS AND WAVINESS WITH FIXED VALUES OF REFERENCE LENGTH Russian patent published in 1995 - IPC

FIELD: measurement technology. SUBSTANCE: device includes light source, collimating lens, semitransparent plate, photodetector to register mirror and diffusion-reflected radiations, condenser composed of two lenses between which light source is positioned. Hole having inner diameter a_i in photodetector is used to register diffusion-reflected radiation. The latter is manufactured in the form of ring having inner radius a_i and outer radius a_j which function as screen. Cylindrical absorber is made separable. It houses collimating lens and photodetector to register diffusion-reflected radiation. Radii a_i and a_j provide for measurement of parameters of roughness with specified reference length. In addition device is fitted with absorber and lens focusing mirror-reflected radiation. Hole of absorber is located uniaxially to specified lens, photodetector for registration of mirror-reflected radiation and center of semitransparent plate. Signal processing unit has two amplifiers, adder and two dividers. EFFECT: enhanced operational reliability and expanded application range. 2 dwg