FIELD: optoelectronic instrumentation engineering; measuring devices. SUBSTANCE: device has multicomponent photodiode detector 1, control- voltage generator 2, first and second analog switches 3 and 9, respectively, storage- retrieval unit 4, scaling amplifier 8, difference amplifier 7, and 2AND-NOT gates 10. Line erase and read pulses are shifted in time during first compensation time step by means of first flip-flop 5 and multiplexer 6 enabling simultaneous amplification of bias voltage across photodiode detector components and check- up of their dark signal. In the process, rated and compensating bias voltages are sequentially set while reading out separate component by means of second flip-flop 11 controlled by pulses picked off control-voltage generator output and second analog switch 9. Compensating bias voltage is shaped by reading out dark signal corresponding to rated bias voltage and passing it through storage-retrieval unit 4 to inverting input of difference amplifier 7. Voltage picked off scaling amplifier 8 is applied to noninverting input of amplifier 7. Compensating voltage shaped in this way is stored in photodiode detector component and its reading out during next time step equalizes dark signal of detector 1 thereby compensating for its irregularity. EFFECT: simplified compensating circuit of device. 5 dwg
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Authors
Dates
1998-12-20—Published
1996-05-30—Filed