FIELD: optico-electron instrumentation, digital multichannel photometers. SUBSTANCE: device compensating for difference in sensitivity of elements of matrix of photodetectors has matrix of photodetectors 1, first matching amplifier 2, analog-to-digital converter 3, computer 4, clock pulse former 5, first and second multiplexers 6, 7, address counter 8, storage 9, digital-to-analog converter 10 and second matching amplifier 11 placed in series. At first stage of operation of device test image with uniform distribution of illumination is projected on to matrix of photodetectors 1 and identical readings of rated reference voltage of analog-to-digital converter 3 are recorded in storage 9. Signals from matrix of photodetectors 1 of test image are read into computer 4 and are recorded from computer in storage 9 in the capacity of readings of compensating reference voltage. Changing voltage which value if propositional to sensitivity of read-out element is element by element fed from output of second matching amplifier 11 to input of reference voltage of analog-to-digital converter 3 for reading of test signal with unspecified distribution of illuminance. Mentioned change of reference voltage of analog-to-digital converter 3 ensures compensation for spread of sensitivity of elements of matrix of photodetectors with minimal usage of hard ware and minimal intricacy of circuit of compensating device. EFFECT: enhanced functional reliability and efficiency. 3 dwg
