DISPLACEMENT INTERFEROMETER Russian patent published in 1999 - IPC

FIELD: measurement of linear length of sections. SUBSTANCE: displacement interferometer is made of movable measurement straight dihedral reflector whose bisector is parallel to direction of its movement, reference reflector, splitter placed in front of reference reflector and three straight dihedral reflectors. First straight dihedral reflector has slit along rib and is installed between movable measurement straight dihedral reflector and second and third straight dihedral reflectors. Bisectors of dihedral reflectors are parallel and ribs of second and third reflectors are parallel one another and orthogonal to sides of slit. Movable measurement straight dihedral reflector is mounted in opposition to additional reflectors and is set at angle of to first reflector. Arms of second and third reflectors are positioned in symmetry with axis of turn of measurement reflector. Dimensions of sides of bases of second and third reflectors are correspondingly equal to (m+1)X, (m-1)X and mX. Splitter is set in front of side of second reflector whose dimension is equal to (m-1)X, where k is odd number, n is even number, m is natural number, X is common measure of sides of bases of second and third additional reflectors. EFFECT: increased measurement precision thanks to increased number of signal ray propagation between interferometer reflectors. 3 dwg