FIELD: computer engineering, automatic test systems, systems testing quality and determining categories. SUBSTANCE: device incorporates group of storages, differentiating element, flip-flop, family of storage registers, group of AND gates, group of comparators each including three storage registers, four adders, eight units of AND gates, unit of OR gates, comparator, inverter, OR gate. EFFECT: widened class of problems to be solved. 1 dwg
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Authors
Dates
2004-01-27—Published
2002-05-27—Filed