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2 227 291

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IPC

(21) (22)

Application

2002111318/28, 2002-04-25

(24)

Start date

2002-04-25

(22)

Actual filing date

2002-04-25

(45)

Published

2004-04-20

(72)

Inventor

Golik V.M.Dzhavaev B.G.Elistratov O.V.

(73)

Holder

Federal'Noe Gosudarstvennoe Unitarnoe Predprijatie Ehlektrokhimicheskij Kombinat"

PROCESS DETERMINING CONTENTS OF IMPURITIES IN XENON Russian patent published in 2004 - IPC

Abstract RU 2227291 C2

FIELD: analysis of materials. SUBSTANCE: characteristic feature of process lies in conducting concentration of impurities in region of high vacuum of mass spectrometer after metering valve by way of partial condensation of xenon at temperature of 77 K. In this case impurities present in xenon and displaying higher values of pressure of saturated vapors and lesser as compared with xenon pressure in flow enter freely ion source of mass spectrometer. EFFECT: markedly raised sensitivity and accuracy of mass spectrometric process of measurements. 3 tbl

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RU 2 227 291 C2

Authors

Golik V.M.

Dzhavaev B.G.

Elistratov O.V.

Dates

2004-04-20—Published

2002-04-25—Filed