METHOD FOR MEASUREMENT OF PARAMETERS RESIDUAL CHARGE OF FLAT DIELECTRICS Russian patent published in 2004 - IPC

Abstract RU 2231804 C1

FIELD: method for measurement of surface density of the real (full) charge and its mean position, as well as of surface densities of effective charges of flat dielectric materials based on induction of current in the circuit of an instrument vibrating capacitor, with the dielectric under test placed between its plates.

SUBSTANCE: the flat dielectric is placed in the gap of the instrument vibrating capacitor, the position of the specimen in the gap of the capacitor is measured, and the capacitor current for various positions of the specimen is measured. The instrument capacitor has an auxiliary vibrating capacitor, whose electric signal is used as a synchronizing one at a comparison of the currents of the instrument capacitor in various positions of the specimen in the gap of the capacitor.

EFFECT: provided detection of variation of the initial phase of the current of the instrument capacitor and excluded probable error in determination of the residual charge of flat dielectrics.

3 dwg

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RU 2 231 804 C1

Authors

Alejnikov N.M.

Alejnikov A.N.

Dates

2004-06-27Published

2003-03-11Filed