METHOD FOR X-RAY FLUORESCENT ANALYSIS OF ELEMENTAL COMPOSITION OF SUBSTANCE Russian patent published in 2004 - IPC

FIELD: technology for elemental analysis of substances.

SUBSTANCE: method includes irradiation of analyzed probes and comparison standard samples by x-ray tube radiation, in spectrum of which characteristic lines are present having wave length λ less than 1A⁰, registration of intensiveness of non-coherently dispersed radiation of x-ray tube anode n_nc, analytical lines of determined n_A and impeding n_M and elements, graduation, for which a linear connection is determined between auxiliary analytical parameter R₁ to intensiveness of analytical lines of determined element n_A and impeding elements n_M. During graduation and determination of parameters and coefficients for calculating auxiliary analytical parameter R₁, considering its dependence from intensiveness of non-coherently dispersed radiation n_nc and non-linearity of its dependence from intensiveness of analytical lines of determined n_A, impeding n_M and non-coherently dispersed radiation n_nc. Additional constant proportion coefficients b_nc, d_A, d_M, d_nc are determined in additional members, which are respectively proportional to intensiveness of non-coherently dispersed radiation n_nc and square values of intensiveness of analytical lines of determined (n_A)², impeding (n_M)² and non-coherently dispersed radiation (n_nc)², while auxiliary analytical parameter R₁ is determined with consideration of these additional coefficients from formula

and calculation of amount of determined element in analyzed sample from formula .

EFFECT: simplified analysis, higher trustworthiness of analysis.

4 dwg