FIELD: tomography, nondestructive test systems, telemechanical monitoring of industrial technologies.
SUBSTANCE: proposed method includes irradiation of LiF or NaF crystals through radiation-resistant mask tightly abutting against them and made in the form of metal screen with mesh aperture measuring 6-10µm and more by means of cyclotron He+ ion beam at energy of 3 ±2 MeV, beam current of 100 to 300 nA, and beam fluence 1 . 1018 to 2 . 1019 m2.
EFFECT: enhanced recording efficiency.
3 cl, 2 dwg
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Authors
Dates
2004-12-27—Published
2003-07-23—Filed