FIELD: measurement technology; digital systems for measuring and checking analog quantities.
SUBSTANCE: proposed controlled-sensitivity analog-to-digital converter built around microcontroller has microcontroller 1 with built-in analog comparator 2 and integrating RC-section components: capacitor 3 labeled C and variable resistor 4 labeled R3, resistors 5 and 6 labeled R1 and R2. First leads of resistors 5 and 6 are connected to output of integrating RC section; second lead of resistor 6 is connected to power supply minus; output of integrating RC section is connected to second input of microcontroller 1 analog comparator 2, input of integrating RC section is connected to digital output of microcontroller 1; first input of analog comparator 2 is connected to input voltage supply Uin.
EFFECT: enhanced sensitivity.
2 cl, 3 dwg
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