FIELD: generation of test data combinations for integrated circuits.
SUBSTANCE: integrated CDMA circuit includes a demodulator for correlating input data with one of the set of codes and generator of test data combinations for expanding input test data with one of a set of codes to generate expanded text data and to provide expanded text data to demodulator. The set of codes may be combined with input text data to generate a set of expanded text data, which are then sent to various components of CDMA microchip to test various components. In one variant, each code from a set of codes contains a scrambling code and an expanding code.
EFFECT: increased efficiency.
3 cl, 3 dwg
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Authors
Dates
2008-04-27—Published
2004-12-21—Filed