LASER CENTRALIZER FOR X-RAY EMITTER Russian patent published in 2008 - IPC H05G1/00 

FIELD: X-ray inspection.

SUBSTANCE: additionally, four identical microlasers are introduced, the optical axes of which are parallel to each other and the X-ray beam axis and are equidistant from it; the optical axes of two microlasers are in planes parallel to the plane formed by the X-ray beam axis and the longitudinal axis of the X-ray emitter; and the axes of the other two microlasers are located in planes parallel to the plane normal to the plane formed by the longitudinal axis of the X-ray emitter and the X-ray beam axis; the microlasers are symmetrical to each other relative to the X-ray beam axis, at distances of from it, in the plane normal to the X-ray beam axis, where B is the side of the square-section radiographic film sheet; in front of the microlasers, at their optical axes, identical cylindric lenses with focal distances of f'=d_L/2tg(α/2), are installed, where d_L is the laser beam diameter, α is the X-ray beam divergence angle; the lenses orientation is such that each lens forms a flat diverging light beam propagating in the plane, in which the optical axis of the corresponding microlaser is located; the cylindrical lenses are used for forming laser strip images on the object, each of the strips being orthogonal relative to the adjacent strip.

EFFECT: the technical effect is increase in X-ray inspection efficiency.

3 dwg.