LASER CENTRALISER FOR X-RAY EMITTER Russian patent published in 2008 - IPC H05G1/00 

FIELD: physics; X-ray inspection.

SUBSTANCE: additionally, two microlasers are introduced, the optical axes of which are located in a plane formed by the X-ray beam axes and the longitudinal axis of the X-ray emitter; the additional microlasers axes are parallel to each other and the X-ray beam axis and are symmetrical relative to this axis, the distance between them is where H and P are the dimensions of the radiographic film in the cartridge; the additional microlasers form two laser spots on the object surface; the distance between the spots on the object does not depend on the distance from the object to the X-ray emitter; in the process of inspection, the spots are aligned with the image of the ring structure of the microlasers by changing the distance from the object to the X-ray emitter, which ensures complete utilisation of the film surface during recording of the radiographic information about the object.

EFFECT: increase in X-ray inspection efficiency.

3 cl, 2 dwg