FIELD: physics, radio.
SUBSTANCE: invention relates to electronics engineering and can be used for checking parametres of semiconductor diodes during their manufacture. The device has a dual-threshold comparator 1, a first reference voltage source 2, a saw-tooth voltage generator 3, a second reference voltage source 4, a diode under investigation 5, a third reference voltage source 6, a comparator 7, a differentiator 8 and a current-to-voltage converter 9.
EFFECT: increased accuracy and reliability of screening.
1 dwg
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