DEVICE FOR REJECTION OF DIODES Russian patent published in 1995 - IPC

Abstract RU 2046366 C1

FIELD: radio engineering. SUBSTANCE: device is intended for testing dynamic parameters of semiconductor diodes. It includes generator of exponential voltage, former of provisional voltage, key, tested diode, current-to-voltage converter, load resistor, sources of reference voltage, comparators and AND gates. EFFECT: enhanced testing efficiency. 1 dwg

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RU 2 046 366 C1

Authors

Piganov M.N.

Shopin G.P.

Aleksandrov V.V.

Dates

1995-10-20—Published

1993-02-26—Filed