METHOD AND DEVICE FOR MEASURING PARAMETRES OF MULTIPLE-ELEMENT TWO-TERMINAL CIRCUITS Russian patent published in 2010 - IPC G01R27/02 

FIELD: physics.

SUBSTANCE: parametres of passive multiple-element two-terminal circuits are measured while powering the measurement object with current pulses which vary during their duration according to an exponential time function, and integration of voltage across the two-terminal circuit. Integral values of voltage across the two-terminal circuit within the limits and adjacent time intervals are calculated from discrete readings of the output voltage of the integrator at the end of the transient process before the end of the pulse. Integration results are substituted into n levels with n unknown generalised parametres of impedance of the two-terminal circuit, and the unknown parametres of the elements of the two-terminal circuit are calculated from the established values of generalised parametres after solving equations.

EFFECT: broader functional capabilities, simplification and unification of the algorithm of measuring parametres of R-C, R-L and R-L-C two-terminal circuits having different equivalent circuits.

2 cl, 2 dwg, 3 ex