METHOD OF TESTING MICROPROCESSOR COMPONENTS, TEST ORACLE FOR TESTING MICROPROCESSOR COMPONENTS, TEST ORACLE OPERATION METHOD, METHOD OF CONSTRUCTING TEST ORACLE Russian patent published in 2011 - IPC G06F11/00 

FIELD: information technology.

SUBSTANCE: at the beginning of each testing cycle, access to a test component is constructed using a test sequence generator and all access input signals are transmitted to the test component and the oracle, after which all output signals of the test component are transmitted to the oracle and their correctness is assessed. The test oracle consists of a model of requirements to the test component which includes description of the interface of the test component, description of internal data of the test component and description of limitations on behaviour of the test component extracted from requirements for the test component and consisting of a list of limitations of data integrity, a list of preconditions for operations, a list of conditions for blocking separate steps, a list of tail conditions for separate steps, and a conveyor model for test component, which includes a conveyor data model, a conveyor shift function and a function for checking correctness of steps.

EFFECT: design of apparatus which employ tests which use the possibility for executing instructions with possibility of their combination.

12 cl, 5 dwg