METHOD TO MEASURE PARAMETERS OF RETROREFLEXION Russian patent published in 2013 - IPC G01M11/02 G01N21/55 

Abstract RU 2497091 C2

FIELD: measurement equipment.

SUBSTANCE: method includes illumination of a sample, registration of reflected radiation, averaging of measurements in different points of the sample. Angles of sample illumination are selected, based on angles of observation: βii/2, where αi - angle of observation of the i photodetector, including αi=0. The first measurement is carried out at α=0 and β=0, half-width w is assessed in the indicatrix of diffusion I(α) at β=0 by the level 0.1 from the maximum value. The angle of scattering βi is changed by βi+1, and registration of averaged values is continued, until in the range from α=0 to α=2βw distribution I(α) becomes double-modal with local minimum with the value of less than 15%-20% from the value 0.5·(I(α=0, β=0)+I(2βw)). The type of the indicatrix of diffusion is defined relative to the direction of mirror reflection I(α-2β) and is approximated with the function fA(x), where x=α-2β. Intensity values are defined in the direction of mirror reflection Im(β), and this function is approximated in the range from β>w/2 (or 15°) to 45° by the function IA(β). Extrapolation IA is carried out (β) into the area β<w/2, and the value IA is determined (β=0). The retroreflexion and the diffusion components are defined as the difference of the following: Ii=I(α=0, β=0) - IA(β=0); for the non-zero (standard) angle βs is calculated as: Ii=I(α=0, β=βs)-fAs)·IAs). If Ii(β=0)<<Ia(β=0), then the investigated sample does not have the true retroreflexion.

EFFECT: increased accuracy of measurements, definition of the ratio between the retroreflexion and diffusion components and the directivity pattern, and minimised measurement time.

7 dwg

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RU 2 497 091 C2

Authors

Ivanov Lev Alekseevich

Kizevetter Dmitrij Vladimirovich

Maljugin Viktor Ivanovich

Dates

2013-10-27Published

2011-08-02Filed