METHOD FOR DETERMINING BREAKDOWN POTENTIAL OF CLEARANCE OF HIGH-VOLTAGE DEVICE Russian patent published in 2013 - IPC G01R31/12 G01R19/00 

FIELD: electricity.

SUBSTANCE: subsequently, tests of initial and high-voltage devices are performed. When testing the initial device, elementary resistors are connected to a system, and its total active resistance is determined. At each fixed value of characteristic parameter, voltage is supplied to a high-voltage electrode of the initial device; then, the above voltage is increased till test voltage of clearance is obtained, and test voltage and test current is measured. For each characteristic parameter there determined is non-linearity coefficient as per the ratio taking into account test voltage of clearance of the initial device, test current and total active resistance of the system of elementary resistors, and medium voltage on the elementary resistor. As per the test results of the initial device there determined is calibration relationship between non-linearity coefficient and medium voltage on the elementary resistor of the system of elementary resistors. When testing the high-voltage device, elementary resistors are connected to a system, and its total active resistance is determined. Voltage is supplied to high-voltage electrode; test current is measured; at fixed characteristic parameter there determined is medium voltage on elementary resistor; non-linearity coefficient is determined as per calibration relationship, and test voltage is calculated as per the ratio taking into account non-linearity coefficient, test current and total active resistance of the system of elementary resistors.

EFFECT: improving accuracy of determination of test voltage of a high-voltage device.

20 cl, 4 dwg