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2 518 409

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(51)

IPC

G01M17/00(2006-01-01)

(21) (22)

Application

2013125294/11, 2013-05-31

(24)

Start date

2013-05-31

(22)

Actual filing date

2013-05-31

(45)

Published

2014-06-10

(72)

Inventor

Arkadov Gennadij ViktorovichGetman Aleksandr FedorovichMikhal'Chuk Aleksandr Vasil'EvichPiminov Vladimir AleksandrovichKazantsev Aleksandr Georgievich

(73)

Holder

Oao Nauchno-Issledovatel'Skij Institut Po Ehkspluatatsii Atomnykh Ehlektrostantsij" Vniiaehs)

METHOD FOR EVALUATING GAMMA-PERCENTILE LIFE OF PRODUCT BY RESULTS OF NONDESTRUCTIVE CHECK USING TEST SAMPLES WITH HIDDEN DEFECTS Russian patent published in 2014 - IPC G01M17/00

Abstract RU 2518409 C1

FIELD: instrumentation.

SUBSTANCE: gamma-percentile life of a product is defined basing on the results of ultrasound, eddy current, radiographic and other methods of nondestructive check of material defects of a product or of group of products. The method is based on the evaluation of residual defectiveness using a test sample with hidden defects.

EFFECT: possibility to evaluate the actual defectiveness of a product after check and repair of the revealed defects and definition of the actual level of gamma-percentile life of a product before it is destructed or damaged in operation.

2 cl, 5 dwg

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RU 2 518 409 C1

Authors

Arkadov Gennadij Viktorovich

Getman Aleksandr Fedorovich

Mikhal'Chuk Aleksandr Vasil'Evich

Piminov Vladimir Aleksandrovich

Kazantsev Aleksandr Georgievich

Dates

2014-06-10—Published

2013-05-31—Filed